Born in Havana, Cuba in 1962, graduated in Physics in 1985, working for the Microelectronics Industry, as head of final control investigations degradation production of electronic components, working for the Electronics Industry, department of reliability, characterization work performed Luma-Chroma plate worker Research   Institute of Metrology, work Challenges of Metrology in Cuba in the era of nanotechnology. Work published in the ISO TC 229, ISO TC229 / IEC 113, required for conformity assessment of research and nano-scale productions Tool page. Master of Science.